Computing and Library Services - delivering an inspiring information environment

Ion beam amorphization of muscovite mica

Templier, C., Desage, F., Desoyer, J. C., Hishmeh, G., Cartz, L., Donnelly, S. E., Vishnyakov, Vladimir and Birtcher, R. C. (1996) Ion beam amorphization of muscovite mica. Journal of Materials Research, 11 (07). pp. 1819-1824. ISSN 0884-2914

Metadata only available from this repository.


The microstructure of a muscovite mica exposed to a rare gas ion beam has been studied by transmission electron microscopy. The investigation of damage without implantation was carried out using argon and helium ions of sufficient energy to traverse the 100–150 nm mica specimens. For 340 keV Ar++ irradiation, amorphization of mica occurred at a fluence as low as 3.5 × 1014 ions · cm−2, which corresponds to 0.29 dpa. Muscovite can be amorphized using 80 keV helium ions, but this requires a much higher fluence and damage production of 4.6 × 10−6 ions · cm−2 and 0.60 dpa, respectively. Since helium irradiation results principally in ionization energy loss, it indicates that amorphization of muscovite results mainly from nuclear interactions. Complete amorphization of muscovite mica is found to take place for all ions at approximately the same amount of nuclear energy transfer to energetic primary knock-on atoms, assuming a recoil energy greater than 500 eV. This suggests that amorphization occurs directly in dense displacement cascades. A significant amount of helium, 100 ppm, can be implanted into muscovite mica without destroying the crystal structure.

Item Type: Article
Subjects: Q Science > QC Physics
Schools: School of Computing and Engineering > Electron Microscopy and Materials Analysis
Related URLs:
Depositing User: Graeme Greaves
Date Deposited: 01 Oct 2013 11:49
Last Modified: 28 Aug 2021 11:32


Downloads per month over past year

Repository Staff Only: item control page

View Item View Item

University of Huddersfield, Queensgate, Huddersfield, HD1 3DH Copyright and Disclaimer All rights reserved ©