In situ real-time measurement for micro-structured surfaces

Jiang, Xiang (2011) In situ real-time measurement for micro-structured surfaces. CIRP Annals - Manufacturing Technology, 60 (1). pp. 563-566. ISSN 0007-8506

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Abstract

A fundamentally improved technology for micro structured surface measurement, based on Wavelength Division Multiplexing (WDM) and Graphics Processing Unit (GPU) techniques is introduced. The WDM technique allows phase-to-depth implementation over large measurement ratios (range/resolution) while the GPU technique allows the analysis of the optical interferograms in real-time. This research attempts to create a new kind of full-field measurement to replace electro-mechanical scanning with white-light interferometry and to form a compact system that is fast, robust and suitable for in situ surface measurement. An experimental system has been developed for the manufacture of diamond turned/fly cut micro-structured surfaces on a large drum diamond turning machine (DTM).

Item Type:	Article
Subjects:	T Technology > T Technology (General) T Technology > TS Manufactures
Schools:	School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Related URLs:	Author
Depositing User:	Sara Taylor
Date Deposited:	23 Apr 2013 13:47
Last Modified:	23 Apr 2013 13:47
URI:	http://eprints.hud.ac.uk/id/eprint/17295

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