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Automatic processing of interferogram from surface roughness measuring interferometer

Chen, Xiaomei and Long, Zuhong (1993) Automatic processing of interferogram from surface roughness measuring interferometer. Acta Optica Sinica, 13 (11). pp. 1040-1044. ISSN 0253-2239
Abstract

Computer-based processing of interferogram of surface roughness measuring intererometer is introduced in the paper, in which threshold segmenting of brightness are used for binary image processing and border following for edge curve sampling.

Information
URI:
https://eprints.hud.ac.uk/id/eprint/16513
Title:
Automatic processing of interferogram from surface roughness measuring interferometer
Creators:
Chen, Xiaomei and Long, Zuhong
Contributors:
ContributionNameEmailORCID
AuthorChen, Xiaomeix.chen2@hud.ac.ukUNSPECIFIED
AuthorLong, ZuhongUNSPECIFIEDUNSPECIFIED
Official URL:
http://www.opticsjournal.net/Journals/gxxb.htm
Date:
November 1993
Subjects:
T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology > TS Manufactures
Schools:
School of Computing and Engineering
Library
Item Type:
Article
Depositing User:
Xiaomei Chen
Date Deposited:
05 Feb 2013 15:19
Revision:
22
Last Modified:
28 Aug 2021 20:14
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