Chen, Xiaomei (1994) Threshold Optimization of interference image of surface roughness measuring interferometer. Acta Optica Sinica, 14 (11). pp. 1183-1186. ISSN 0253-2239
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Abstract
In this paper, a brief and effective method-arithmatic mean thresholding is suggested for segmenting interference image of complex light interferometer used in automatic measurement of surface roughness. The roughness profile information extracted from binary image after thresholding and the calculated results by sampling enough height deviation data from roughness profile coinside with those charted and measured by TALYSURF 6 profilemeter. This thresholding method is also suitable for segmenting interference image of laser surface roughness interferometer.
Item Type: | Article |
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Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering T Technology > TS Manufactures |
Schools: | School of Computing and Engineering |
Related URLs: | |
Depositing User: | Xiaomei Chen |
Date Deposited: | 29 Jan 2013 12:12 |
Last Modified: | 28 Aug 2021 20:14 |
URI: | http://eprints.hud.ac.uk/id/eprint/16511 |
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