Threshold Optimization of interference image of surface roughness measuring interferometer

Chen, Xiaomei (1994) Threshold Optimization of interference image of surface roughness measuring interferometer. Acta Optica Sinica, 14 (11). pp. 1183-1186. ISSN 0253-2239

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Abstract

In this paper, a brief and effective method-arithmatic mean thresholding is suggested for segmenting interference image of complex light interferometer used in automatic measurement of surface roughness. The roughness profile information extracted from binary image after thresholding and the calculated results by sampling enough height deviation data from roughness profile coinside with those charted and measured by TALYSURF 6 profilemeter. This thresholding method is also suitable for segmenting interference image of laser surface roughness interferometer.

Item Type:	Article
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering T Technology > TS Manufactures
Schools:	School of Computing and Engineering
Related URLs:	Author
Depositing User:	Xiaomei Chen
Date Deposited:	29 Jan 2013 12:12
Last Modified:	28 Aug 2021 20:14
URI:	http://eprints.hud.ac.uk/id/eprint/16511

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