Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors

Fraser, George W., Lees, John E, Pearson, James F, Nichols, Anthony P and Bailey, Paul (1994) Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors. Proceedings of SPIE, 2280. pp. 101-108. ISSN 0277-786X

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Abstract

We describe our recent synchrotron measurements of microchannel plate (MCP) quantum detection efficiency made in pulse-counting mode in a 40-300 eV band containing the L shell absorption edges of silicon. The significance of this data for the calibration of the HRC-S transmission grating detector for the AXAF-I X-ray observatory is discussed.

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URI:

https://eprints.hud.ac.uk/id/eprint/14714

URI:

https://eprints.hud.ac.uk/id/eprint/14714

Title:

Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors

Creators:

Fraser, George W., Lees, John E, Pearson, James F, Nichols, Anthony P and Bailey, Paul

Identification Number:

https://doi.org/10.1117/12.186803

Official URL: