Metrological characteristics of dual-tree complex wavelet transform for surface analysis

Zeng, Wenhan, Jiang, Xiang and Scott, Paul J. (2005) Metrological characteristics of dual-tree complex wavelet transform for surface analysis. Measurement Science and Technology, 16 (7). pp. 1410-1417. ISSN 0957-0233

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Abstract

The metrological characteristics of a newly developed dual-tree complex wavelet transform (DT-CWT) for surface analysis are investigated, especially on the aspect of transmission characteristics analysis. The property of zero/linear phase by the DT-CWT ensures filtering results with no distortion and good ability for feature localization. Due to the 'steep transmission curve' property of the amplitude transmission characteristic, the DT-CWT can separate different frequency components efficiently. Both computer simulation and experimental results of practical surface 2D/3D filtering prove that the DT-CWT filter is very suitable for the separation and extraction of frequency components such as surface roughness, waviness and form

Item Type:	Article
Subjects:	T Technology > T Technology (General) Q Science > QC Physics
Schools:	School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Related URLs:	Author Author
Depositing User:	Briony Heyhoe
Date Deposited:	08 Aug 2008 15:17
Last Modified:	02 Dec 2010 13:53
URI:	http://eprints.hud.ac.uk/id/eprint/1441

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