Li, Feng, Longstaff, Andrew P., Fletcher, Simon and Myers, Alan (2012) Integrated Tactile and Optical Measuring Systems in Three Dimensional Metrology. In: Proceedings of The Queen’s Diamond Jubilee Computing and Engineering Annual Researchers’ Conference 2012: CEARC’12. University of Huddersfield, Huddersfield, pp. 1-6. ISBN 978-1-86218-106-9

Coordinate measuring machine (CMM) technology is widely used in inspection, but sometimes it is not suitable for measuring complex parts in dimensional metrology or reverse engineering owing its inherent slow speed. On the other hand, optical scanning sensors acquire data rapidly, but have poorer accuracy and access restrictions. Multi-sensor systems allow selection of discrete probing or scanning methods to measure part elements. The decision is often based on the principle that tight tolerance elements should be measured by contact methods, while other more loose tolerance elements can be scanned by optical sensors. This article summarizes recent developments and applications of hybrid tactile and non-contact 3D measuring systems and gives examples of its applications in dimensional metrology. Recent and future developments will concentrate on improved measuring reliability, reduced uncertainty of measurement data and higher accuracy and lower costs.

Cover pages
Cover_pages.pdf - Published Version

Download (1MB) | Preview
F_Li_Paper.pdf - Published Version

Download (262kB) | Preview


Downloads per month over past year

Downloads per month over past year for

Downloads per month over past year for

Add to AnyAdd to TwitterAdd to FacebookAdd to LinkedinAdd to PinterestAdd to Email