Approximation of surface roughness profiles and parameters

Brennan, James K., Crampton, Andrew, Jiang, Xiang, Leach, Richard K. and Harris, Peter M. (2005) Approximation of surface roughness profiles and parameters. In: International Conference on Advanced Mathematical and Computational Tools in Metrology (AMCTM 2005), 27–29 June, 2005, Instituto Português da Qualidade, Caparica, Portugal. (Unpublished)

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Item Type:	Conference or Workshop Item (Poster)
Subjects:	T Technology > T Technology (General) T Technology > TA Engineering (General). Civil engineering (General)
Schools:	School of Computing and Engineering School of Computing and Engineering > Automotive Engineering Research Group School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group School of Computing and Engineering > High-Performance Intelligent Computing School of Computing and Engineering > High-Performance Intelligent Computing > Planning, Autonomy and Representation of Knowledge School of Computing and Engineering > High-Performance Intelligent Computing > Planning, Autonomy and Representation of Knowledge ?? tserg ?? School of Computing and Engineering > High-Performance Intelligent Computing > Information and Systems Engineering Group
Related URLs:	Conference Author Author
Depositing User:	Briony Heyhoe
Date Deposited:	21 Jul 2008 13:49
Last Modified:	28 Aug 2021 10:39
URI:	http://eprints.hud.ac.uk/id/eprint/1147

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