Brennan, James K., Crampton, Andrew, Jiang, Xiang, Leach, Richard K. and Harris, Peter M. (2005) Approximation of surface roughness profiles and parameters. In: International Conference on Advanced Mathematical and Computational Tools in Metrology (AMCTM 2005), 27–29 June, 2005, Instituto Português da Qualidade, Caparica, Portugal. (Unpublished)
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