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Wavelets and their applications for surface metrology

Jiang, Xiang, Scott, Paul J. and Whitehouse, D.J. (2008) Wavelets and their applications for surface metrology. CIRP Annals - Manufacturing Technology, 57 (1). pp. 555-558. ISSN 0007-8506

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Abstract

This paper presents three generations of wavelet representations that are designed for micro/nano-scale surfaces. These wavelets include a basic biorthogonal wavelet (for the establishment of a surface filtering equation), an evolutionary lifting wavelet (for surface oriented frequency analysis, surface recognition and reconstruction with nano-scale accuracy) and a complex wavelet (for surface morphological feature extraction). The benefits of using these wavelets in the subject area will be demonstrated throughout as follows (1) their metrology properties: the linear phase, finite impulse filtering, simplicity and naturalness, shift-invariance and direction sensitivity; (2) practical applications in surface measurement denoising, feature extraction for engineering and bioengineering surfaces.

Item Type: Article
Subjects: T Technology > TJ Mechanical engineering and machinery
T Technology > TA Engineering (General). Civil engineering (General)
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Graham Stone
Date Deposited: 29 Apr 2009 12:42
Last Modified: 02 Dec 2010 13:22
URI: http://eprints.hud.ac.uk/id/eprint/4084

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