Potdar, Akshay Anand, Fletcher, Simon and Longstaff, Andrew P. (2016) Performance characterisation of a new photo-microsensor based sensing head for displacement measurement. Sensors and Actuators A: Physical, 238. pp. 60-70. ISSN 09244247
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This paper presents a robust displacement sensor with nanometre-scale resolution over a micrometre range. It is composed of low cost commercially available slotted photo-microsensors (SPMs). The displacement sensor is designed with a particular arrangement of a compact array of SPMs with specially designed shutter assembly and signal processing to significantly reduce sensitivity to ambient light, input voltage variation, circuit electronics drift, etc. The sensor principle and the characterisation results are described in this paper. The proposed prototype sensor has a linear measurement range of 20 μm and resolution of 21 nm. This kind of sensor has several potential applications, including mechanical structural deformation monitoring system.
|Uncontrolled Keywords:||Displacement sensor; Nanometer-scale resolution; Micrometer range; IR slotted photomicro-sensors (SPMs); Mechanical shutter; Self-correction arrangement|
|Subjects:||T Technology > TJ Mechanical engineering and machinery
T Technology > TK Electrical engineering. Electronics Nuclear engineering
|Schools:||School of Computing and Engineering > Centre for Precision Technologies > Engineering Control and Machine Performance Research Group
School of Computing and Engineering
|Depositing User:||Akshay Potdar|
|Date Deposited:||18 Dec 2015 10:18|
|Last Modified:||05 Dec 2016 12:02|
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