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Molecular dynamic simulation of low-energy FIB irradiation induced damage in diamond

Tong, Zhen, Xu, Zongwei, Wu, Wei and Luo, Xichun (2015) Molecular dynamic simulation of low-energy FIB irradiation induced damage in diamond. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 358. pp. 38-44. ISSN 0168-583X

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Abstract

In this article, a large scale multi-particle molecular dynamics (MD) simulation model was developed to study the dynamic structural changes in single crystal diamond under 5 keV Ga+ irradiation in conjunction with a transmission electron microscopy (TEM) experiment. The results show that the thickness of ion-induced damaged layer (~ 9.0 nm) obtained from experiments and simulations has good accordance, which demonstrates the high accuracy achieved by the developed MD model. Using this model, the evolution of atomic defects, the spatial distributions of implanted Ga particles the thermal spike at the very core collision area were analysed. The local thermal recrystallizations observed during each single ion collision process and the increase of the density of the non-diamond phase (mostly sp2 bonded) at irradiation area are fund to be the underling mechanisms responsible for ion fluence dependent amorphization of diamond observed in previous experiments.

Item Type: Article
Subjects: Q Science > Q Science (General)
Q Science > QC Physics
T Technology > TJ Mechanical engineering and machinery
Schools: School of Computing and Engineering
Depositing User: Zhen Tong
Date Deposited: 22 Jun 2015 14:36
Last Modified: 30 May 2016 14:09
URI: http://eprints.hud.ac.uk/id/eprint/24811

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