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Identifying and Characterizing Micro-machining Signatures on Freeform Surfaces Using Morphological Methods

Lou, Shan, Jiang, Xiang and Scott, Paul J. (2013) Identifying and Characterizing Micro-machining Signatures on Freeform Surfaces Using Morphological Methods. In: Manufacturing the future conference 2013, 17-18 September 2013, Cranfield University, UK. (Unpublished)

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Abstract

Freeform surfaces are replacing traditional surfaces and have significantly reduced volume and weight and highly improved performance in modern complex optic systems, bio-systems and other disciplines [1]. These high-precision freeform components are enabled by state-of-the-art micro-machining technologies, compromising mechanical methods (diamond turning and polishing etc.), physical methods (laser beam and ion beam machining), and chemical methods (lithography, electro-chemical machining etc.). However, a fundamental pre-requisite to achieve the potential growth to these high-added value freeform components is to measure and characterize these components with the required accuracy such that their manufacturing
quality can be controlled. The surface topography is a fingerprint of all process stages of the
manufacturing process. Thus identifying and evaluating these topographical features on freeform surfaces left by production techniques are critically important in that they could present an indication of the manufacturing quality and offer feedback to the process control.

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Item Type: Conference or Workshop Item (Poster)
Uncontrolled Keywords: Surface metrology; morphological method
Subjects: T Technology > TJ Mechanical engineering and machinery
Schools: School of Computing and Engineering > Centre for Precision Technologies > EPSRC Centre for Innovative Manufacturing in Advanced Metrology
School of Computing and Engineering
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References:

[1] Jiang X., Scott, P. J. and Whitehouse, D. 2007 Freeform surface characterisation – a fresh strategy, CIRP Annals, 56(1): 278-282.
[2] Jiang X., Lou, S. and Scott, P. J. 2012 Morphological Method for Surface Metrology and Dimensional Metrology Based on the Alpha Shape, Measurement science and technology, 23(1): 015003.

Depositing User: Shan Lou
Date Deposited: 15 Nov 2013 11:33
Last Modified: 02 Dec 2016 17:24
URI: http://eprints.hud.ac.uk/id/eprint/19109

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