Li, Tukun, Blunt, Liam A., Jiang, Xiangqian and Zeng, Wenhan (2013) An Information Model for Surface Metrology. Procedia CIRP, 10. pp. 251-258. ISSN 2212-8271
- Published Version
Available under License Creative Commons Attribution Non-commercial No Derivatives.
According to ISO standards, the specification and verification of surface texture includes an ordered set of operations. In order to reduce the specification uncertainty, it is of importance to model the significant information related to surface measurement. This paper documents the development of a XML-based information model for surface metrology. Traditional paper-based documents with unstructured data are intergraded into one structured data for surface metrology. Therefore, it limits the specification uncertainty and enhances the reproducibility of surface measurement.
|Subjects:||T Technology > TJ Mechanical engineering and machinery|
|Schools:||School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
|Depositing User:||Tukun Li|
|Date Deposited:||24 Sep 2013 12:10|
|Last Modified:||04 Dec 2016 07:51|
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