Jiang, Xiang (2011) In situ real-time measurement for micro-structured surfaces. CIRP Annals - Manufacturing Technology, 60 (1). pp. 563-566. ISSN 0007-8506Metadata only available from this repository.
A fundamentally improved technology for micro structured surface measurement, based on Wavelength Division Multiplexing (WDM) and Graphics Processing Unit (GPU) techniques is introduced. The WDM technique allows phase-to-depth implementation over large measurement ratios (range/resolution) while the GPU technique allows the analysis of the optical interferograms in real-time. This research attempts to create a new kind of full-field measurement to replace electro-mechanical scanning with white-light interferometry and to form a compact system that is fast, robust and suitable for in situ surface measurement. An experimental system has been developed for the manufacture of diamond turned/fly cut micro-structured surfaces on a large drum diamond turning machine (DTM).
|Subjects:||T Technology > T Technology (General)
T Technology > TS Manufactures
|Schools:||School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
|Depositing User:||Sara Taylor|
|Date Deposited:||23 Apr 2013 13:47|
|Last Modified:||23 Apr 2013 13:47|
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