Lou, Shan, Zeng, Wenhan, Jiang, Xiang and Scott, Paul J. (2012) Comparison of Robust Filtration Techniques in Geometrical Metrology. In: 18th International Conference on Automation and Computing (ICAC) 2012. IEEE, Leicestershire, UK, pp. 1-6. ISBN 978-1-4673-1722-1
|PDF - Published Version |
Restricted to Repository staff only until 01 September 2015.
Filtration is one of core elements of analysis tools in geometrical metrology. Filtration techniques are progressing along with the advancement of manufacturing technology. The modern filtration techniques are requested to be robust against outliers, applicable to surfaces with complex form and reliable in whole range of measurement data. A comparison study is conducted to evaluate the commonly used robust filtration techniques in geometrical metrology, including the two-stage Gaussian filter, the robust Gaussian regression filter, the robust spline filter and morphological filters. They are compared in terms of four aspects: functionality, mathematical computation, capability and characterization parameters. As a result, it offers metrologists an instruction to choose the appropriate filter for various applications.
|Item Type:||Book Chapter|
|Subjects:||T Technology > TJ Mechanical engineering and machinery|
|Schools:||School of Computing and Engineering|
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
 X. Jiang, P. J. Scott, D. J. Whitehouse and L. Blunt, “Paradigm shifts in surface metrology, Part I. Historical philosophy”, Pro. R. Soc. A., vol. 463 pp. 2071-2099, 2007.
|Depositing User:||Shan Lou|
|Date Deposited:||27 Sep 2012 12:05|
|Last Modified:||05 Jun 2013 12:47|
Downloader CountriesMore statistics for this item...
Repository Staff Only: item control page