The Ni(100)(2×2)p4g–N reconstruction determined by surface X-ray diffraction

Dudzik, E., Norris, A.G., McGrath, R., Charlton, G., Thornton, G., Murphy, B., Turner, Tracy and Norman, D. (1999) The Ni(100)(2×2)p4g–N reconstruction determined by surface X-ray diffraction. Surface Science, 433-45. pp. 317-321. ISSN 0039-6028

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Abstract

The ‘clock’ reconstruction of the Ni(100)(2×2)p4g–N system has been measured using surface X-ray diffraction. An in-plane displacement of the surface layer Ni atoms of dxy=0.30±0.01 Å was found. This value is smaller than that measured for this system using photoelectron diffraction (PED) and surface extended X-ray absorption fine structure (SEXAFS). Possible reasons for this are discussed.

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URI:

https://eprints.hud.ac.uk/id/eprint/19610

Title:

The Ni(100)(2×2)p4g–N reconstruction determined by surface X-ray diffraction

Creators:

Dudzik, E., Norris, A.G., McGrath, R., Charlton, G., Thornton, G., Murphy, B., Turner, Tracy and Norman, D.

Identification Number:

10.1016/S0039-6028(99)00125-9

Official URL:

http://dx.doi.org/10.1016/S0039-6028(99)00125-9

Date: