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Ion beam modification of the structure and properties of hexagonal boron nitride: An infrared and X-ray diffraction study

Aradi, Emily, Naidoo, Mervin, Billing, David, Wamwangi, Daniel, Motochi, Isaac and Derry, Trevor Edward (2014) Ion beam modification of the structure and properties of hexagonal boron nitride: An infrared and X-ray diffraction study. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 331. pp. 140-143. ISSN 0168-583X

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Abstract

The vibrational mode for the cubic symmetry of boron nitride (BN) has been produced by boron ion implantation of hexagonal boron nitride (h-BN). The optimum fluence at 150 keV was found to be 5 × 1014 ions/cm2. The presence of the c-BN phase was inferred using glancing incidence XRD (GIXRD) and Fourier Transform Infrared Spectroscopy (FTIR). After implantation, Fourier Transform Infrared Spectroscopy indicated a peak at 1092 cm−1 which corresponds to the vibrational mode for nanocrystalline BN (nc-BN). The glancing angle XRD pattern after implantation exhibited c-BN diffraction peaks relative to the implantation depth of 0.4 μm.

Item Type: Article
Uncontrolled Keywords: Ion implantation; Boron nitride; Glancing incidence XRD; Fourier Transform Infrared Spectroscopy
Subjects: Q Science > QC Physics
Schools: School of Applied Sciences
Related URLs:
Depositing User: Emily Aradi
Date Deposited: 28 Nov 2016 11:04
Last Modified: 28 Nov 2016 11:04
URI: http://eprints.hud.ac.uk/id/eprint/29789

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