The Ni(100)(2×2)p4g–N reconstruction determined by surface X-ray diffraction

Dudzik, E., Norris, A.G., McGrath, R., Charlton, G., Thornton, G., Murphy, B., Turner, Tracy and Norman, D. (1999) The Ni(100)(2×2)p4g–N reconstruction determined by surface X-ray diffraction. Surface Science, 433-45. pp. 317-321. ISSN 0039-6028

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Abstract

The ‘clock’ reconstruction of the Ni(100)(2×2)p4g–N system has been measured using surface X-ray diffraction. An in-plane displacement of the surface layer Ni atoms of dxy=0.30±0.01 Å was found. This value is smaller than that measured for this system using photoelectron diffraction (PED) and surface extended X-ray absorption fine structure (SEXAFS). Possible reasons for this are discussed.

Item Type:	Article
Subjects:	Q Science > QC Physics
Schools:	Research and Enterprise Directorate
Related URLs:	Author
Depositing User:	Rosemary Wood
Date Deposited:	27 Mar 2014 16:00
Last Modified:	28 Aug 2021 11:35
URI:	http://eprints.hud.ac.uk/id/eprint/19610

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