Interface structure of Si(111)-(√3 × √3)R30°-ErSi2 − x

Lohmeier, M., Huisman, W.J., Vlieg, E., Nishiyama, A., Nicklin, C.L. and Turner, Tracy (1996) Interface structure of Si(111)-(√3 × √3)R30°-ErSi2 − x. Surface Science, 345 (3). pp. 247-260. ISSN 0039-6028

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Abstract

The interface structure of epitaxial ErSi2 − x (x ≈ 0.3) on Si(111) has been measured by means of surface X-ray diffraction. The silicide consists of a stack of alternating Si and Er planes. The Si planes resemble compressed substrate bilayers, in which a regular network of vacancies releases the compressive strain. This vacancy network gives rise to a (√3 × √3)R30° reconstruction of the silicide, in which Si atoms are displaced towards the vacancies, and Er atoms are displaced away from the vacancies. The Si-Si bond length in the silicide is , and the nearest-neighbour ErSi distance is . The positions of the ato the interface region are identical to those found for two-dimensional erbium silicide on Si(111), and first-layer Er atoms are located on T4 sites on the substrate. Our preparation method (reactive deposition epitaxy) leads to rough silicide films. Nevertheless, we are able to extract the atomic occupancies of eight individual layers. All silicide layers are reconstructed, but only the silicide layer at the interface shows long-range order of the vacancy network.

Item Type:	Article
Subjects:	Q Science > QC Physics
Schools:	Research and Enterprise Directorate
Related URLs:	Author
Depositing User:	Rosemary Wood
Date Deposited:	27 Mar 2014 15:52
Last Modified:	04 Apr 2018 11:30
URI:	http://eprints.hud.ac.uk/id/eprint/19604

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