Wood, T.J., Bonet, C., Noakes, T.C.Q., Bailey, Paul and Tear, S.P. (2005) A medium-energy ion scattering investigation of the structure and surface vibrations of two-dimensional YSi2 grown on Si(111). Surface Science, 598 (1-3). pp. 120-127. ISSN 0039-6028
Metadata only available from this repository.Abstract
Medium-energy ion scattering has been used to determine the atomic structure of two-dimensional yttrium silicide on silicon (1 1 1). A full quantitative analysis of the atomic positions of the Si atoms in the top bilayer yields a model similar to that previously suggested in the literature with a Si1–Si2 vertical spacing of 0.80 ± 0.03 Å, but with the Si bilayer relaxed slightly further away from the Y layer (Si2–Y vertical spacing of 1.89 ± 0.02 Å). Observing the effects of the top bilayer vibrations yields a model with significant enhancements
Item Type: | Article |
---|---|
Subjects: | Q Science > Q Science (General) Q Science > QC Physics |
Schools: | School of Applied Sciences |
Related URLs: | |
Depositing User: | Sharon Beastall |
Date Deposited: | 12 Sep 2012 11:06 |
Last Modified: | 28 Aug 2021 11:21 |
URI: | http://eprints.hud.ac.uk/id/eprint/14857 |
Downloads
Downloads per month over past year
Repository Staff Only: item control page
![]() |
View Item |