Second layer rumpling in Ni()c(2×2)–S

Woodhead, A.P, Bailey, Paul, Noakes, T.C.Q, Norman, D and Thornton, G (2002) Second layer rumpling in Ni()c(2×2)–S. Surface Science, 496 (3). pp. 299-306. ISSN 0039-6028

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Abstract

Medium energy ion scattering (MEIS) using 100 keV H+ ions has been used to study the structure of Ni(110)c(2×2)–S. Blocking curves in two of the three principal azimuths have been measured in order to determine the atomic positions in both the surface and sub-surface layers. The MEIS data indicate that S lies 0.90±0.06 Å above the plane of the first layer Ni. The average distance of 1.39±0.04 Å found for the first to second nickel layer spacing corresponds to an expansion of 12% when compared to the bulk layer spacing and we find a rumpling of 0.18±0.07 Å in the second layer. The polarity of rumpling is such that Ni atoms capped by S lie closer to the surface.

Item Type:	Article
Subjects:	Q Science > Q Science (General) Q Science > QC Physics
Schools:	School of Applied Sciences
Related URLs:	Author
Depositing User:	Sharon Beastall
Date Deposited:	11 Sep 2012 09:49
Last Modified:	11 Sep 2012 09:49
URI:	http://eprints.hud.ac.uk/id/eprint/14792

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