CN-induced surface layer expansion of Ni(110): a MEIS study

Brown, D., Woodruff, D.P., Noakes, T.C.Q. and Bailey, Paul (2001) CN-induced surface layer expansion of Ni(110): a MEIS study. Surface Science, 476 (3). L241-L246. ISSN 0039-6028

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Abstract

Medium energy ion scattering (MEIS) using 100 keV H+ incident ions has been used to determine the outermost substrate layer spacings of clean Ni(1 1 0) and Ni(1 1 0)c(2×2)-CN. Experimental blocking curves were obtained using [100], [112] and [101] ion incident directions and these have been interpreted with the aid of theoretical simulations for different model structures. For the Ni(1 1 0)c(2×2)-CN surface phase the ion scattering data indicate a substrate outermost layer expansion of 21.2±1.6%, providing independent confirmation of the large CN-induced surface layer relaxation obtained in an earlier scanned-energy mode photoelectron diffraction study of this surface.

Item Type:	Article
Subjects:	Q Science > Q Science (General) Q Science > QC Physics
Schools:	School of Applied Sciences
Related URLs:	Author
Depositing User:	Sharon Beastall
Date Deposited:	11 Sep 2012 09:01
Last Modified:	11 Sep 2012 09:01
URI:	http://eprints.hud.ac.uk/id/eprint/14784

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