Eames, C., Reakes, M., Tear, S., Noakes, T. and Bailey, Paul (2010) Phase selection in the rare earth silicides. Physical Review B, 82 (17). p. 174112. ISSN 1098-0121

The rare earth silicides form islands with a tetragonal or a hexagonal structure that coexist when grown on the Si(100) surface. We show using medium energy ion scattering that it is possible to selectively grow one of these as a pure phase by controlling the mobility of the rare earth atoms as they are deposited. When dysprosium, holmium, and erbium are deposited onto a liquid nitrogen cooled substrate the hexagonal structural phase is formed after annealing. When erbium and holmium are deposited onto a hot substrate only the tetragonal phase results. For dysprosium silicide growth under conditions of high mobility causes approximately equal numbers of hexagonal and tetragonal islands to form. The system offers a means to obtain fine control over physical properties such as the Schottky barrier height.

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