Petrik, Peter, Milita, Silvia, Pucker, Georg, Nassiopoulou, Androula G., Van den Berg, Jakob, Reading, Michael A., Fried, Miklos, Lohner, Tivadar, Theodoropoulou, M, Gardelis, Spyros, Barozzi, Mario, Ghulinyan, Mher, Lui, Alberto, Vanzetti, Lia and Picciotto, Antonio (2009) Preparation and Characterization of Nanocrystals using Ellipsometry and X-ray Diffraction. ECS Transactions, 25 (3). pp. 373-378. ISSN 1938-5862

Nanocrystalline semiconductors embedded in dielectric matrices are currently under investigation for use in Si-photonics and in memory devices. The aim of a joint research activity in the FP6-ANNA*) project ( is to develop and improve metrologies for the measurement of nanocrystal properties.

Add to AnyAdd to TwitterAdd to FacebookAdd to LinkedinAdd to PinterestAdd to Email