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Wang, Jian, Jiang, Xiang and Blunt, Liam (2010) Simulation of Adaptive Sampling in Profile Measurement for Structured Surfaces. In: Future Technologies in Computing and Engineering: Proceedings of Computing and Engineering Annual Researchers' Conference 2010: CEARC’10. University of Huddersfield, Huddersfield, pp. 48-53. ISBN 9781862180932
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Abstract
Adaptive sampling is a novel sampling design that can redirect sampling effort during a survey in
response to the observed values. Its application on surface texture measurement is new, such as
working with stylus profilometers. As a start, this paper focuses on a classical one-dimensional
adaptive sampling in surface texture measurement for structured surfaces. The sampling simulations
show that both the reconstruction accuracy and repeatability have a significant improvement
compared to the uniform sampling – the most prevalent strategy at present.
| Item Type: | Book Chapter |
|---|---|
| Uncontrolled Keywords: | adaptive sampling, uniform sampling, profile measurement, structured surfaces |
| Subjects: | T Technology > T Technology (General) T Technology > TA Engineering (General). Civil engineering (General) |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Computing and Engineering Annual Researchers' Conference (CEARC) School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
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| Depositing User: | Sharon Beastall |
| Date Deposited: | 13 Jan 2011 10:07 |
| Last Modified: | 13 Jan 2011 10:07 |
| URI: | http://eprints.hud.ac.uk/id/eprint/9314 |
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