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Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2010) Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford. (Unpublished)

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Item Type: Conference or Workshop Item (Speech)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology > TS Manufactures
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Feng Gao
Date Deposited: 19 Nov 2010 15:34
Last Modified: 26 Sep 2013 08:53
URI: http://eprints.hud.ac.uk/id/eprint/9072

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