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Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2010) Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford. (Unpublished)
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Official URL: http://www.clf.rl.ac.uk/18838.aspx
| Item Type: | Conference or Workshop Item (Speech) |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering T Technology > TS Manufactures |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
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| Depositing User: | Feng Gao |
| Date Deposited: | 19 Nov 2010 15:34 |
| Last Modified: | 22 Jun 2011 14:01 |
| URI: | http://eprints.hud.ac.uk/id/eprint/9072 |
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