Martin, Haydn (2010) Investigations into a multiplexed fibre interferometer for on-line, nanoscale, surface metrology. Doctoral thesis, University of Huddersfield.
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Current trends in technology are leading to a need for ever smaller and more complex featured surfaces. The techniques for manufacturing these surfaces are varied but are tied together by one limitation; the lack of useable, on-line metrology
instrumentation. Current metrology methods require the removal of a workpiece for characterisation which leads to machining down-time, more intensive labour and generally presents a bottle neck for throughput.
In order to establish a new method for on-line metrology at the nanoscale investigation are made into the use of optical fibre interferometry to realise a compact probe that is robust to environmental disturbance. Wavelength tuning is combined with a dispersive element to provide a moveable optical stylus that sweeps the surface. The phase variation caused by the surface topography is then analysed using phase shifting interferometry.
A second interferometer is wavelength multiplexed into the optical circuit in order to track the inherent instability of the optical fibre. This is then countered using a closed loop control to servo the path lengths mechanically which additionally counters external vibration on the measurand. The overall stability is found to be limited by polarisation state evolution however.
A second method is then investigated and a rapid phase shifting technique is employed in conjunction with an electro-optic phase modulator to overcome the polarisation state evolution. Closed loop servo control is realised with no mechanical movement and a step height artefact is measured. The measurement result shows good correlation with a measurement taken with a commercial white light interferometer.
|Item Type:||Thesis (Doctoral)|
|Subjects:||T Technology > T Technology (General)|
|Schools:||School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
|Depositing User:||Joanna Mahoney|
|Date Deposited:||12 Oct 2010 11:52|
|Last Modified:||23 Aug 2015 12:10|
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