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Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1989) A Laser Heterodyne Interferometer for Measuring Nanometer Displacement. In: 2nd IMEKO TC14 International Symposium on Metrology for Quality Control in Production, 1989, Beijing, China.
Metadata only available from this repository.| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | Q Science > QC Physics |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
| Related URLs: | |
| Depositing User: | Feng Gao |
| Date Deposited: | 06 Jul 2010 16:21 |
| Last Modified: | 02 Dec 2010 13:44 |
| URI: | http://eprints.hud.ac.uk/id/eprint/8001 |
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