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Calibration of Standard Using a Scanning Probe Microscope

Gao, F., Harms, C., Zhao, X. and Koenders, L. (1997) Calibration of Standard Using a Scanning Probe Microscope. In: European Workshop on Micro-technology and Scanning Probe Microscope, 1997, Mainz, Germany .

Metadata only available from this repository.
Item Type: Conference or Workshop Item (Paper)
Subjects: Q Science > QC Physics
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Feng Gao
Date Deposited: 06 Jul 2010 14:19
Last Modified: 02 Dec 2010 13:38
URI: http://eprints.hud.ac.uk/id/eprint/7992

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