Development of a new multi-function tribological Microscope

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Gao, F. and Liu, X (2000) Development of a new multi-function tribological Microscope. In: 1st euspen Topical Conference on Fabrication and Metrology in Nanotechnology and 2nd Annual General Meeting of euspen, 31 May - 2 June, 2000 , Copenhagen, Denmark.

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Item Type:	Conference or Workshop Item (Paper)
Subjects:	T Technology > TJ Mechanical engineering and machinery Q Science > QC Physics
Schools:	School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Related URLs:	Author Organisation
Depositing User:	Feng Gao
Date Deposited:	06 Jul 2010 14:16
Last Modified:	02 Dec 2010 13:36
URI:	http://eprints.hud.ac.uk/id/eprint/7985

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