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Development of a new multi-function tribological Microscope

Gao, F. and Liu, X (2000) Development of a new multi-function tribological Microscope. In: 1st euspen Topical Conference on Fabrication and Metrology in Nanotechnology and 2nd Annual General Meeting of euspen, 31 May - 2 June, 2000 , Copenhagen, Denmark.

Metadata only available from this repository.
Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TJ Mechanical engineering and machinery
Q Science > QC Physics
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Feng Gao
Date Deposited: 06 Jul 2010 14:16
Last Modified: 02 Dec 2010 13:36
URI: http://eprints.hud.ac.uk/id/eprint/7985

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