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A multi-functional tribological probe microscope for surface and surface related properties

Gao, F. and Liu, X. (2000) A multi-functional tribological probe microscope for surface and surface related properties. In: The euspen nanotechnology workshop and Joint Warwick-Tokyo Nanotechnology Symposium, Sep. 2000, Warwick, UK.

Metadata only available from this repository.
Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TJ Mechanical engineering and machinery
Q Science > QC Physics
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Feng Gao
Date Deposited: 06 Jul 2010 13:53
Last Modified: 02 Dec 2010 13:36
URI: http://eprints.hud.ac.uk/id/eprint/7981

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