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Multi-function evaluation of surfaces at micro/nano scales by a new tribological probe microscope

Liu, X. and Gao, F. (2001) Multi-function evaluation of surfaces at micro/nano scales by a new tribological probe microscope. In: 2nd euspen International Conference, 27-31, May 2001, Turin, Italy.

Metadata only available from this repository.
Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TJ Mechanical engineering and machinery
Q Science > QC Physics
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Depositing User: Feng Gao
Date Deposited: 06 Jul 2010 14:00
Last Modified: 02 Dec 2010 13:35
URI: http://eprints.hud.ac.uk/id/eprint/7980

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