Multi-function evaluation of surfaces at micro/nano scales by a new tribological probe microscope

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Liu, X. and Gao, F. (2001) Multi-function evaluation of surfaces at micro/nano scales by a new tribological probe microscope. In: 2nd euspen International Conference, 27-31, May 2001, Turin, Italy.

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Item Type:	Conference or Workshop Item (Paper)
Subjects:	T Technology > TJ Mechanical engineering and machinery Q Science > QC Physics
Schools:	School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Depositing User:	Feng Gao
Date Deposited:	06 Jul 2010 14:00
Last Modified:	02 Dec 2010 13:35
URI:	http://eprints.hud.ac.uk/id/eprint/7980

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