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V-groove measurement with white light interferometry

Gao, F., Coupland, J. M. and Petzing, J. (2006) V-groove measurement with white light interferometry. In: Photon06, 4-7 September, 2006, Manchester.

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    Abstract

    White Light Interferometry (WLI) provides a fast and convenient means to
    measure surface profile. With sub-nanometre resolution and non-contacting operation,
    WLI is also a promising means to estimate surface roughness parameters. In recent
    years, however, several articles have concluded that great care must be taken to
    interpret the output of this type of instrument. For example the measurement of step
    artefacts often show a systematic error of a few tens of nanometres or so in
    magnitude, when the step height is less than the coherence length of the source, and
    surface roughness is generally overestimated by a similar value. Other error sources
    exist but for the most part systematic errors in WLI are less than, or of the order of,
    half a wavelength. In this paper, we report for the first time, that WLI should also be
    used with caution when it is used to measure the profile of V-grooves. We show that
    an inverted measurement profile with an error magnitude of several hundred microns
    is possible in this instance. Using a simple ray based model we show that this effect
    can be attributed to multiple reflections and can have a magnitude. Although, this
    experiment is somewhat contrived, we maintain that similar discrepancies exist in the
    measurement of abraded surfaces and discuss the implications of this type of error in
    the estimation of surface roughness.

    Item Type: Conference or Workshop Item (Paper)
    Uncontrolled Keywords: White light interferometry, V-groove measurement, surface roughness measurement, multiple scattering effect.
    Subjects: T Technology > TJ Mechanical engineering and machinery
    Q Science > QC Physics
    Schools: School of Computing and Engineering
    School of Computing and Engineering > Centre for Precision Technologies
    School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
    Related URLs:
    Depositing User: Feng Gao
    Date Deposited: 06 Jul 2010 12:25
    Last Modified: 02 Dec 2010 13:32
    URI: http://eprints.hud.ac.uk/id/eprint/7977

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