Search:
Computing and Library Services - delivering an inspiring information environment

Measurement of structured surface using stylus, AFM and optical methods

Gao, F., Petzing, J, Coupland, J. M. and Leach, Richard K. (2007) Measurement of structured surface using stylus, AFM and optical methods. In: Metrology and properties of engineering surfaces: proceedings of the 11th international conference, Huddersfield, on 17th-20th July 2007. University of Huddersfield, Huddersfield, UK, p. 363. ISBN 1862180571

Metadata only available from this repository.
Item Type: Book Chapter
Subjects: T Technology > TJ Mechanical engineering and machinery
Q Science > QC Physics
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Related URLs:
Depositing User: Feng Gao
Date Deposited: 06 Jul 2010 10:06
Last Modified: 02 Dec 2010 13:31
URI: http://eprints.hud.ac.uk/id/eprint/7976

Item control for Repository Staff only:

View Item

University of Huddersfield, Queensgate, Huddersfield, HD1 3DH Copyright and Disclaimer All rights reserved ©