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Wavelength Scanning Interferometer for Structured Surfaces

Jiang, Xiang, Gao, F. and Wang, Kaiwei (2010) Wavelength Scanning Interferometer for Structured Surfaces. In: ASPE Summer Topical Meeting on Precision Interferometric Metrology, 23rd - 25th June 2010, Asheville, North Carolina, USA.

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Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TS Manufactures
T Technology > TJ Mechanical engineering and machinery
Q Science > QC Physics
Schools: School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Feng Gao
Date Deposited: 05 Jul 2010 09:45
Last Modified: 24 Aug 2015 11:32
URI: http://eprints.hud.ac.uk/id/eprint/7967

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