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Jiang, Xiang, Gao, F. and Wang, Kaiwei (2010) Wavelength Scanning Interferometer for Structured Surfaces. In: ASPE Summer Topical Meeting on Precision Interferometric Metrology, 23rd - 25th June 2010, Asheville, North Carolina, USA.
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Official URL: http://www.aspe.net/meetings/2010_Summer/2010_Summ...
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | T Technology > TS Manufactures T Technology > TJ Mechanical engineering and machinery Q Science > QC Physics |
| Schools: | School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
| Related URLs: | |
| Depositing User: | Feng Gao |
| Date Deposited: | 05 Jul 2010 10:45 |
| Last Modified: | 02 Dec 2010 09:58 |
| URI: | http://eprints.hud.ac.uk/id/eprint/7967 |
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