Zeng, Wenhan, Jiang, Xiang and Scott, Paul J. (2005) Complex ridgelets for the extraction of morphological features on engineering surfaces. Journal Paper of Physics: Conference Series, 13. pp. 246-249. ISSN 1742-6588
Metadata only available from this repository.Abstract
In this paper, a complex ridgelets transform, which provides approximate shift invariance analysis of line singularities, is proposed to extract morphological features with linear or directional/objective property, by taking a Dual Tree Complex Wavelet Transform (DT-CWT) on the projections of the Finite Radon Transform (FRAT). The Numerical experiments show the remarkable potential of this methodology to analyse engineering and bioengineering surfaces with liner scratches in comparison to wavelet-based methods developed in our pervious work
| Item Type: | Article |
|---|---|
| Subjects: | T Technology > T Technology (General) T Technology > TA Engineering (General). Civil engineering (General) Q Science > QC Physics |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
| Related URLs: | |
| References: | [1] Chen X, Raja J and Simanapalli S 1995 Int. J. Mach. Tools Manuf. 35 231 |
| Depositing User: | Briony Heyhoe |
| Date Deposited: | 01 May 2008 15:19 |
| Last Modified: | 02 Dec 2010 13:57 |
| URI: | http://eprints.hud.ac.uk/id/eprint/705 |
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