Wang, J, Jiang, Xiang and Blunt, Liam (2009) A survey of potential sampling strategies for measurement of structured surfaces. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2009: CEARC’09. University of Huddersfield, Huddersfield, pp. 184-189. ISBN 9781862180857
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Uniform sampling is the predominant sampling method for surface measuring instruments. However, measurement for structured surfaces brings an increasingly serious conflict between sampling range and small resolution. A flexible sampling design based on sufficient previous knowledge of the surface ingredient is a potential solution. Adaptive sampling techniques are such strategies. In this paper basic specifications and drawbacks of uniform sampling schemes were issued. As potential solutions, some advanced adaptive sampling methods e.g. sequential stopping sampling, optimal model-based strategies and adaptive allocation strategies etc which were raised from computer graphics, CAD/CAM and CMM measurement are surveyed. However, transplanting of these strategies to surface metrology instruments is still questionable. Two basic questions are raised at the end.
|Item Type:||Book Chapter|
|Uncontrolled Keywords:||Structured surfaces, advanced adaptive sampling, uniform sampling|
|Subjects:||T Technology > T Technology (General)|
|Schools:||School of Computing and Engineering|
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Computing and Engineering Annual Researchers' Conference (CEARC)
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
|Depositing User:||Sharon Beastall|
|Date Deposited:||28 Jan 2010 10:32|
|Last Modified:||26 Nov 2010 09:57|
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