Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2009) Interferograms analysis for wavelength scanning interferometer using convolution and fourier transform. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2009: CEARC’09. University of Huddersfield, Huddersfield, pp. 33-37. ISBN 9781862180857
|PDF - Published Version |
A convolution and fast Fourier transform methods are proposed separately to analysis a set of interferograms obtained from measurement results of a wavelength scanning interferometer. This paper describes wavelength scanning interferometer setup and the operation principle. Mathematical explanations, for both interferograms analysis methods, are presented. Results of measuring 3μm step height sample, using both interferograms analysis methods, are demonstrated. The results show that the convolution method provides better evaluation for the surface profile than the fast Fourier transform.
|Item Type:||Book Chapter|
|Uncontrolled Keywords:||Convolution; FFT; interferometry; interference fringes|
|Subjects:||T Technology > T Technology (General)|
T Technology > TL Motor vehicles. Aeronautics. Astronautics
|Schools:||School of Computing and Engineering|
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
School of Computing and Engineering > Computing and Engineering Annual Researchers' Conference (CEARC)
|Depositing User:||Sharon Beastall|
|Date Deposited:||27 Jan 2010 10:42|
|Last Modified:||26 Sep 2013 09:54|
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