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Characterisation Platform For Surface Metrology

Lan, Xiangqi, Jiang, Xiang, Blunt, Liam, Xiao, Shaojun and Xie, Fang (2009) Characterisation Platform For Surface Metrology. In: University of Huddersfield Research Festival, 23rd March - 2nd April 2009, University of Huddersfield. (Unpublished)

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    Abstract

    The measurement and characterisation of surface texture are the most critical factors and important functionality indicators.The real surfaces is continuous, but a discrete data set is acquired by any metrology instrumentation. After a series of processes of the finite digital sample, the parameters, which are the link betweenthe surface texture, the functionality excepted and the manufacturing process, will be calculated for the surface characterisation. This platform is designed to realize the analysis and processes for the surface characterisation.

    Item Type: Conference or Workshop Item (Poster)
    Subjects: T Technology > T Technology (General)
    T Technology > TA Engineering (General). Civil engineering (General)
    Schools: School of Computing and Engineering
    School of Computing and Engineering > Centre for Precision Technologies
    School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
    Depositing User: Cherry Edmunds
    Date Deposited: 22 Jul 2009 10:12
    Last Modified: 26 Nov 2010 10:04
    URI: http://eprints.hud.ac.uk/id/eprint/5215

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