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Pattern analysis and metrology: the extraction of stable features from observable measurements

Scott, Paul J. (2004) Pattern analysis and metrology: the extraction of stable features from observable measurements. Proceedings of the Royal Society, A, 460. pp. 2845-2864. ISSN 1364-5021

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    Abstract

    To extract patterns from observable measurements we need to be able to define and identify stable features in observable measurements that persist in the presence of small artificial features such as noise, measurement errors, etc. The representational theory of measurement is used to define the stability of a measurement procedure. A technique, 'motif analysis', is defined to identify and remove 'insignificant' features while leaving 'significant' features. This technique is formalized and three properties identified that ensure stability. The connection of motif analysis with morphological closing filters is established and used to prove the stability of motif analysis. Finally, a practical metrology example is given of motif analysis in surface texture. Here motif analysis is used to segment a surface into its significant features.

    Item Type: Article
    Additional Information: UoA 25 (General Engineering) © 2004 The Royal Society
    Subjects: T Technology > TA Engineering (General). Civil engineering (General)
    Schools: School of Computing and Engineering
    School of Computing and Engineering > Centre for Precision Technologies
    School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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    References:

    Blunt, L. & Ebdon, S. 1996 The application of three-dimensional surface measurement techniques
    to characterizing grinding wheel topography. Int. J. Mach. Tools Manufact. 36, 1207–
    1226.
    Cameron, P. J. 1994 Combinatorics: topics, techniques, algorithms. Cambridge University Press.
    Finkelstein, L. 1982 Theory and philosophy of measurement. In Handbook of measurement science.
    Vol. 1. Fundamental principles (ed. P. H. Sydenham). Wiley.
    Hand, D. J. 1996 Statistics and the theory of measurement. J. R. Stat. Soc. A159(3), 445–492.
    Kweon, I. S. & Kanade, T. 1994 Extracting topographic terrain features from elevation maps.
    CVGIP Image Understanding 59, 171–182.
    Maxwell, J. C. 1870 On hills and dales. Phil. Mag. 40, 421–427.Narens, L. 1985 Abstract measurement theory. London: MIS Press.
    Pfaltz, J. L. 1976 Surface networks. Geograph. Analysis 8, 77–93.
    Roberts, F. S. 1979 Measurement theory with applications to decision making, and the social
    sciences. In Encyclopaedia of mathematics and its applications, vol. 7. Addison-Wesley.
    Schalkoff, R. 1992 Pattern recognition, statistical, structural and neural approaches. Wiley.
    Scott, P. J. 1992 The mathematics of motif combination and their use for functional simulation.
    Int. J. Mach. Tools Manufact. 32, 69–73.
    Scott, P. J. 2001 An algorithm to extract critical points from lattice height data. Int. J. Mach.
    Tools Manufact. 41, 1889–1897.
    Serra, J. 1982 Image analysis and mathematical morphology, vol. 1. Academic.
    Takahashi, S., Ikeda, T., Shinagawa, Y., Kunii, T. L. & Ueda, M. 1995 Algorithms for extracting
    correct critical points and constructing topological graphs from discrete geographical elevation
    data. Comput. Graph. Forum 14, 181–192.
    VIM 1993 International vocabulary of basic and general terms in metrology. International Organization
    for Standardization, Geneva.
    Wolf, G. W. 1991 A Fortran subroutine for cartographic generalization. Comput. Geosci. 17,
    1359–1381.

    Depositing User: Briony Heyhoe
    Date Deposited: 03 Oct 2007
    Last Modified: 03 Dec 2010 09:42
    URI: http://eprints.hud.ac.uk/id/eprint/414

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