Kumar, P., Martin, H. and Jiang, X. (2016) Towards the development of a hybrid-integrated chip interferometer for online surface profile measurements. Review of Scientific Instruments, 87 (6). ISSN 0034-6748
- Published Version
Restricted to Repository staff only until 3 June 2017.
Non-destructive testing and online measurement of surface features are pressing demands in manufacturing. Thus optical techniques are gaining importance for characterization of complex engineering surfaces. Harnessing integrated optics for miniaturization of interferometry systems onto a silicon wafer and incorporating a compact optical probe would enable the development of a handheld sensor for embedded metrology applications. In this work, we present the progress in the development of a hybrid photonics based metrology sensor device for online surface profile measurements. The measurement principle along with test and measurement results of individual components has been presented. For non-contact measurement, a spectrally encoded lateral scanning probe based on the laser scanning microscopy has been developed to provide fast measurement with lateral resolution limited to the diffraction limit. The probe demonstrates a lateral resolution of ∼3.6 μm while high axial resolution (sub-nanometre) is inherently achieved by interferometry. Further the performance of the hybrid tuneable laser and the scanning probe was evaluated by measuring a standard step height sample of 100 nm.
|Subjects:||Q Science > QC Physics
T Technology > TA Engineering (General). Civil engineering (General)
T Technology > TJ Mechanical engineering and machinery
|Schools:||School of Computing and Engineering|
|Depositing User:||Prashant Kumar|
|Date Deposited:||10 Jun 2016 15:10|
|Last Modified:||10 Jun 2016 15:13|
Downloads per month over past year
Repository Staff Only: item control page