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Complex ridgelets for shift invariant characterizaion of surface topography with line singularities

Ma, J.W., Jiang, Xiang and Scott, Paul J. (2005) Complex ridgelets for shift invariant characterizaion of surface topography with line singularities. Physics Letters A, 344. pp. 423-431. ISSN 0375-9601

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    Abstract

    A complex ridgelet transform, which provides shift invariance and good performance for line singularities, is proposed to solve the problems with existing wavelet-based methods in surface metrology by taking a dual-tree complex wavelet transform on the projections of the finite Radon transform. Numerical experiments show the efficiency of this methodology in approximation, denoising, and characterization of engineering and bioengineering surfaces with straight scratches.

    Item Type: Article
    Additional Information: © 2005 Elsevier B.V. All rights reserved.
    Uncontrolled Keywords: Ridgelets; Surface characterization; Radon transform; Shift invariance; Line singularities
    Subjects: T Technology > TA Engineering (General). Civil engineering (General)
    Schools: School of Computing and Engineering
    School of Computing and Engineering > Centre for Precision Technologies
    School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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    References:

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    Depositing User: Briony Heyhoe
    Date Deposited: 12 Jul 2007
    Last Modified: 02 Dec 2010 12:57
    URI: http://eprints.hud.ac.uk/id/eprint/281

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