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Future developments in surface metrology

Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2003) Future developments in surface metrology. In: Advanced Techniques for Assessment Surface Topography. Kogan Page, London, pp. 339-347. ISBN 1903996112

Metadata only available from this repository.
Item Type: Book Chapter
Subjects: T Technology > T Technology (General)
Q Science > QA Mathematics
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Briony Heyhoe
Date Deposited: 25 Nov 2008 16:11
Last Modified: 26 Nov 2010 12:09
URI: http://eprints.hud.ac.uk/id/eprint/2756

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