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Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2003) Future developments in surface metrology. In: Advanced Techniques for Assessment Surface Topography. Kogan Page, London, pp. 339-347. ISBN 1903996112
Metadata only available from this repository.| Item Type: | Book Chapter |
|---|---|
| Subjects: | T Technology > T Technology (General) Q Science > QA Mathematics |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
| Related URLs: | |
| Depositing User: | Briony Heyhoe |
| Date Deposited: | 25 Nov 2008 16:11 |
| Last Modified: | 26 Nov 2010 12:09 |
| URI: | http://eprints.hud.ac.uk/id/eprint/2756 |
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