Recent advances in traceable nanoscale dimension and force metrology in the UK

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Forbes A B and Leach R K 2005 Self-calibration of a novel surface texture measuring instrument Proc. 7th Lambdamap Conf. (Cranfield, UK, 27-30 June)
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Leach R K and Bennett I 2004 Characterisation of a new vertical scanning white light interferometer-a test case? Proc. 11th Int. Coll. on Surfaces (Chemnitz, Germany, 2-3 Feb.) pp 11-8
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Nunn J 2000 Calibration of 2 dimensional magnification standards for SPMs and SEMs through optical diffraction: method, traceability and uncertainties Proc. 4th Seminar on Quantitative Microscopy QM 2000 (Braunschweig, Germany) pp 17-24
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Royal Society and Royal Academy of Engineering 2004 Nanoscience and Nanotechnologies: Opportunities and Uncertainties
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Thomsen-Schmidt P and Krüger-Sehm R 2004 Development of a new stylus contacting system for roughness measurement Proc. 11th Int. Coll. on Surfaces (Chemnitz, Germany, 2-3 Feb.) pp 79-85
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