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Double slit interferometry to measure the EUV refractive indices of solids using high harmonics.

Wilson, L. A., Rossall, A. K., Wagenaars, E., Cacho, C. M., Springate, E., Turcu, I. C. E. and Tallents, G. J. (2012) Double slit interferometry to measure the EUV refractive indices of solids using high harmonics. Applied Optics, 51 (12). pp. 2057-2061. ISSN 0003-6935

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Abstract

Accurate values of the extreme ultraviolet (EUV) optical properties of materials are required to make EUV optics such as filters and multilayer mirrors. The optical properties of aluminum studied in this report are required, in particular, as aluminum is used as an EUV filter material. The complex refractive index of solid aluminum and the imaginary part of the refractive index of solid iron between 17 eV and 39 eV have been measured using EUV harmonics produced from an 800 nm laser focused to 1014  Wcm2 in an argon gas jet impinging on a double slit interferometer.

Item Type: Article
Uncontrolled Keywords: Optical constants,Soft x-rays,Transmission
Subjects: Q Science > QC Physics
Schools: School of Computing and Engineering
Related URLs:
Depositing User: Andrew Rossall
Date Deposited: 13 Apr 2016 11:07
Last Modified: 13 Apr 2016 11:07
URI: http://eprints.hud.ac.uk/id/eprint/26817

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