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Why is numerical analysis important to metrology?

Crampton, Andrew (2001) Why is numerical analysis important to metrology? In: National Measurement and British Electro Magnetic Conference, November 2001, Harrogate.

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Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Schools: School of Computing and Engineering
School of Computing and Engineering > Automotive Engineering Research Group
School of Computing and Engineering > Diagnostic Engineering Research Centre
School of Computing and Engineering > Diagnostic Engineering Research Centre > Energy, Emissions and the Environment Research Group
School of Computing and Engineering > Diagnostic Engineering Research Centre > Machinery Condition and Performance Monitoring Research Group
School of Computing and Engineering > Diagnostic Engineering Research Centre > Measurement System and Signal Processing Research Group
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Depositing User: Cherry Edmunds
Date Deposited: 29 Oct 2008 16:03
Last Modified: 10 Dec 2010 13:44
URI: http://eprints.hud.ac.uk/id/eprint/2489

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