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Wavelength Scanning Interferometery for large area roll to roll metrology applications in photovoltaic manufacturing environment

Elrawemi, Mohamed, Blunt, Liam, Fleming, Leigh and Muhamedsalih, Hussam (2014) Wavelength Scanning Interferometery for large area roll to roll metrology applications in photovoltaic manufacturing environment. In: 10th LVMC Large Volume Metrology Conference and Exhibition, 18th -20th November 2014, The Mercure Manchester Piccadilly, UK.

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Abstract

The wavelength scanning interferometer is currently being applied as a core metrology technology as part of the EU project NanoMend - Nanoscale Defect Detection, Cleaning and Repair for Large Area Substrates ̴500 mm width.
NanoMend Project aims to develop technologies that are able to detect and correct micro and nano-scale defects in roll-to-roll produced films in order to improve product performance, yield and lifetime.

Item Type: Conference or Workshop Item (Poster)
Subjects: T Technology > TS Manufactures
Schools: School of Computing and Engineering > Centre for Precision Technologies > EPSRC Centre for Innovative Manufacturing in Advanced Metrology
School of Computing and Engineering
Depositing User: Mohamed Elrawemi
Date Deposited: 25 Nov 2014 15:14
Last Modified: 06 Dec 2016 06:21
URI: http://eprints.hud.ac.uk/id/eprint/22447

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