Elrawemi, Mohamed, Blunt, Liam, Fleming, Leigh and Muhamedsalih, Hussam (2014) Wavelength Scanning Interferometery for large area roll to roll metrology applications in photovoltaic manufacturing environment. In: 10th LVMC Large Volume Metrology Conference and Exhibition, 18th -20th November 2014, The Mercure Manchester Piccadilly, UK.
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The wavelength scanning interferometer is currently being applied as a core metrology technology as part of the EU project NanoMend - Nanoscale Defect Detection, Cleaning and Repair for Large Area Substrates ̴500 mm width.
NanoMend Project aims to develop technologies that are able to detect and correct micro and nano-scale defects in roll-to-roll produced films in order to improve product performance, yield and lifetime.
|Item Type:||Conference or Workshop Item (Poster)|
|Subjects:||T Technology > TS Manufactures|
|Schools:||School of Computing and Engineering > Centre for Precision Technologies > EPSRC Centre for Innovative Manufacturing in Advanced Metrology
School of Computing and Engineering
|Depositing User:||Mohamed Elrawemi|
|Date Deposited:||25 Nov 2014 15:14|
|Last Modified:||22 Dec 2016 16:07|
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