Martin, Haydn, Kumar, Prashant and Jiang, Xiangqian (2014) A hybrid photonics based sensor for surface measurement. CIRP Annals - Manufacturing Technology, 63 (1). pp. 549-552. ISSN 0007-8506Metadata only available from this repository.
By integrating photonic devices on a silicon wafer containing etched waveguides it is possible to create a complete optical system-on-chip. Such a device can contain all the elements required for implementing a wide range of interferometry techniques including wavelength scanning and phase shifting. In this paper we introduce a hybrid photonics based sensor for surface metrology applications containing the following ‘on-chip’ components: tunable laser, phase-shifter, wavelength de-multiplexer, and wavelength encoder. This paper presents the design of the system-on-chip as a miniaturised sensor. Initial experimental results are shown which prove the potential of this device as a viable surface measurement tool.
|Subjects:||T Technology > T Technology (General)|
|Schools:||School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > EPSRC Centre for Innovative Manufacturing in Advanced Metrology
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
|Depositing User:||Prashant Kumar|
|Date Deposited:||08 May 2014 15:39|
|Last Modified:||17 Jul 2014 10:42|
Downloads per month over past year
Repository Staff Only: item control page