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Transmission Electron Microscopy of Amorphisation and Recrystallisation of Silicon Nanowires under in situ Ion Irradiation

Hanif, Imran, Hinks, J. A. and Donnelly, S. E. (2013) Transmission Electron Microscopy of Amorphisation and Recrystallisation of Silicon Nanowires under in situ Ion Irradiation. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2013 : CEARC'13. University of Huddersfield, Huddersfield, p. 231. ISBN 9781862181212

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Item Type: Book Chapter
Subjects: T Technology > T Technology (General)
T Technology > TA Engineering (General). Civil engineering (General)
Schools: School of Computing and Engineering
School of Computing and Engineering > Computing and Engineering Annual Researchers' Conference (CEARC)
School of Computing and Engineering > Electron Microscopy and Materials Analysis
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Depositing User: Sharon Beastall
Date Deposited: 19 Dec 2013 11:03
Last Modified: 10 Dec 2016 10:10
URI: http://eprints.hud.ac.uk/id/eprint/19402

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