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Single ion induced spike effects on thin metal films: observation and simulation

Donnelly, S. E., Birtcher, R. C. and Nordlund, K. (2005) Single ion induced spike effects on thin metal films: observation and simulation. In: Engineering thin films and nanostructures with ion beams. Taylor & Francis, pp. 7-78. ISBN 9781420028294

Metadata only available from this repository.
Item Type: Book Chapter
Subjects: Q Science > QC Physics
Schools: School of Computing and Engineering > Electron Microscopy and Materials Analysis
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Depositing User: Graeme Greaves
Date Deposited: 03 Oct 2013 08:13
Last Modified: 03 Oct 2013 08:13
URI: http://eprints.hud.ac.uk/id/eprint/18758

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